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**Stats** The failure rate of a certain electronic device is suspected to increase linearly with its temparature . Fit a least- square linear line through the data (two measurments were taken for each given temparature)

$\displaystyle

\begin{array}{|c|c|c|c|c|c|c|}

Temp^{\cdot} F & 55 & 65 & 70 & 85 & 95 & 105 \\

Failure \; rate. 10^6 & 1.90 & 1.93 & 1.97 & 2.00 & 2.01 & 2.01 \\

&1.94 & 1.95 & 1.97 & 2.02 & 2.02 & 2.04

\end{array}

$

i) Obtain desired least-square line

ii) Obtain predicted failure rate at $\displaystyle 70^{\cdot}$ F