**The following is a random experiment. **

A wafer from a semiconductor manufacturing is to be selected randomly

and a location on the wafer inspected for contamination particles.

The sample space for the number of contamination particles at the inspected location is:

S = {0, 1, 2, 3, 4, 5}.

Relative frequencies for these outcomes are 0.40, 0.20, 0.15, 0.10, 0.05 and 0.10 respectively.

Use relative as probabilities.

Let A be the event that there are no contamination particles at the inspected location.

Let B be the event that there are at most three contamination particles at the inspected location.

Let C be the event that there are an odd number of contamination particles at the inspected location.

1- How many events are possible?

2- Find the probability of the following:

. . .complement of A

. . .B and C (B intersection C)

. . .B union C
For the first question:

Total events = 2^6

. No, there are simply **six** possible outcomes.
For the second question I did:

Probability for

*No contamination particles* = (0.6)(0.8)(0.85)(0.9)(0.95)(0.9)

so: Prob(A') is just: 1 - (0.6)(0.8)(0.85)(0.9)(0.95)(0.9)

. Right!